ISO/DIS 16666

Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

SDO:

ISO

Language:

English

ICS Codes:

71.040.40

Status:

Draft

Publish date:

1969-12-30

Standard Number:

ISO/DIS 16666