ISO 19606:2024
This document specifies a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy. This method applies to surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, Rsm, in the range of about 0,04 μm to 2,5 μm.
SDO:
ISO
Language:
English
ICS Codes:
81.060.30
Status:
Published
Publish date:
2024-10-31
Standard Number:
ISO 19606:2024