ISO 14975:2000

Surface chemical analysis — Information formats

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

SDO:

ISO

Language:

English

ICS Codes:

35.240.70; 71.040.40

Status:

Published

Publish date:

2000-12-06

Standard Number:

ISO 14975:2000