ISO 8769-2:1996

Reference sources for the calibration of surface contamination monitors — Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV

Specifies the characteristics of reference sources for the calibration of surface contamination monitors that are traceable to national measurement standards. Relates to a series of sources emitting electrones of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.

SDO:

ISO

Language:

English

ICS Codes:

17.240

Status:

Withdrawn

Publish date:

1996-11-20

Standard Number:

ISO 8769-2:1996