IEC 60147-2C:1970

Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high- frequency parameters.
SDO:
IEC
Language:
English
ICS Codes:
31.080.10
Status:
Withdrawn
Publish date:
Standard Number:
IEC 60147-2C:1970