IEC 60147-0:1966

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

SDO:

IEC

Language:

English

ICS Codes:

31.080.10

Status:

Withdrawn

Publish date:

1965-12-31

Standard Number:

IEC 60147-0:1966