IEC 61445:2012

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:<br /> a) UUT Model;<br /> b) Stimulus and Response;<br /> c) Fault Dictionary;<br /> d) Probe.