IEC 60749-30:2005/AMD1:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

SDO:

IEC

Language:

English

ICS Codes:

31.080.01

Status:

Revised

Publish date:

2011-05-24

Standard Number:

IEC 60749-30:2005/AMD1:2011