IEC 62527:2007
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
SDO:
IEC
Language:
English
ICS Codes:
25.040.01
Status:
Published
Publish date:
2007-11-06
Standard Number:
IEC 62527:2007