IEC 62526:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
SDO:
IEC
Language:
English
ICS Codes:
25.040.01
Status:
Published
Publish date:
2007-11-06
Standard Number:
IEC 62526:2007