IEC 60749-31:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.

SDO:

IEC

Language:

English

ICS Codes:

31.080.01

Status:

Published

Publish date:

2002-08-29

Standard Number:

IEC 60749-31:2002