IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.

SDO:

IEC

Language:

English

ICS Codes:

31.080.01

Status:

Published

Publish date:

2002-08-29

Standard Number:

IEC 60749-8:2002