IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

SDO:

IEC

Language:

English

ICS Codes:

31.080.01

Status:

Published

Publish date:

2002-08-29

Standard Number:

IEC 60749-1:2002