IEC 60747-10:1991
It is a generic specification for semiconductor devices, discrete
devices and integrated circuits, including multichip integrated
circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in
the IECQ System and gives general rules for measuring methods of
electrical characteristics, climatic and mechanical tests, and
endurance tests.
SDO:
IEC
Language:
English
ICS Codes:
31.080.01;
31.200
Status:
Withdrawn
Publish date:
1991-05-20
Standard Number:
IEC 60747-10:1991