Gives dimensions and tolerances for electronic tube and valve bases, holders and caps, together with the relevant gauges and gauging procedure, to ensure interchangeability. Also includes recommended practice for the preparation of drawings of electronic tubes and valves. This is a loose-leaf publication and supplements, containing new or revised sheets, are issued from time to time.
Indique les dimensions avec les tolérances nécessaires des embases, des douilles et des culots des tubes électroniques et les calibres et procédés de calibrage correspondants, afin de permettre l'interchangeabilité. Contient également des recommandations pour la préparation des dessins de tubes électroniques destinés à figurer dans cette publication. Cette publication est composée de…
Lays down the conditions and procedure for carrying out impulse tests on cables and their accessories, with a view to rationalizing the practice in different laboratories, and thus to facilitate valid comparisons between the results obtained on cables made to different specifications.
Notes:
1.This publication should be read in conjunction with IEC 60060 and 60141.
2.For voltage measurements…
Fixe les conditions et les modalités d'essais de choc des câbles et de leurs accessoires en vue d'uniformiser la pratique des différents laboratoires et de faciliter les comparaisons valables entre les résultats obtenus sur des câbles répondant à des spécifications différentes.
Note:
1. Cette publication doit être lue conjointement avec les CEI 60060 et 60141.
2. Pour la mesure des…
Specifies interchangeable starters used with pre-heat type tubular fluorescent lamps and should be used in conjunction with corresponding publications for fluorescent lamps and their ballasts.
Essential ratings and characteristics of semiconductor devices and general principles of measuring m...
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.